OTHER BRANDS

Main Functions

Analog Input Measurement Offer 80 single‑ended or 40 differential analog input channels with 16‑bit ADC resolution; aggregate maximum sampling rate reaches 250 kS/s. Software‑selectable input voltage ranges: ±0.2 V, ±1 V, ±5 V, ±10 V. It converts external analog sensor voltage signals into digital data for host computer processing, with guaranteed no‑missing‑code performance and built‑in over‑voltage protection for input terminals.More products: www.plcva.com
Analog Output Signal Generation Equipped with 2‑channel 16‑bit analog output, maximum update rate up to 833 kS/s. It generates precise analog voltage control signals to drive actuators, simulates sensor output signals for equipment testing and verification.

PCI‑6225

Digital Input / Output 24 programmable digital I/O lines, each configurable as input or output. Support reading digital status of external switches, relays and sensors, as well as sending digital control signals to drive peripheral devices, with terminal voltage protection feature.
Counter‑Timer & Timing Trigger Integrate two 32‑bit counter‑timer units. Support edge counting, pulse width measurement, frequency measurement, quadrature encoder position reading, and pulse‑train output. Hardware digital triggering supports synchronous sampling across multiple I/O channels and multi‑card synchronization via RTSI bus.
Driver & Software Compatibility Work with NI‑DAQmx driver library. Compatible with LabVIEW, C/C++, Python and other development environments. Realize hardware configuration, data streaming, onboard FIFO buffering, data recording and fault diagnosis functions on Windows industrial PC platforms.

PCI‑6225

Laboratory Research & Academic Test: Multi‑channel sensor signal acquisition for mechanical stress, temperature, pressure, vibration test; widely used for prototype validation and experimental data logging.
Industrial Product Test & Manufacturing Test: Multi‑point voltage signal monitoring for production fixture test‑stands; simulate analog/digital signals to verify function of electronic assemblies. High‑channel‑count design reduces total hardware quantity for multi‑sensor test systems.
Hardware‑In‑the‑Loop (HIL) Simulation: Serve as I/O interface for real‑time simulation systems, exchange analog and digital signals between simulation host and physical hardware under test.
Machine Condition Monitoring: Collect multi‑point analog signals from transducers for equipment status monitoring.